WebOct 1, 2004 · Edge termination is a critical technology for power devices to fully realize their voltage blocking potential. During the last decade, a few methods have been used for power devices in silicon and SiC. These include, field plating, guard rings and junction termination extension (JTE) techniques. While the guard ring technique is well known in ... WebA p-type epitaxy guard ring termination for a SiC Schottky Barrier Diode is described in “The Guard-Ring Termination for High-Voltage SiC Schottky Barrier Diodes” by Ueno et al., IEEE …
Guard Rings - Terminations for vertical devices in SiC - 123dok
WebJul 31, 2000 · An optimized multiple floating guard ring structure is investigated for the first time as an edge termination method for high voltage 4H-SiC planar devices. Simulations … WebMar 10, 1996 · @misc{etde_401462, title = {Guard-ring termination for high-voltage SiC Schottky barrier diodes; Guard ring shutan kozo wo sonaeta kotaiatsu SiC Schottky barrier diode} author = {Ueno, K, Urushidani, T, and Seki, Y} abstractNote = {Silicon carbide (SiC) has been attracting attention as a material for power devices, and has already demonstrated … micron navigator 769 sds
Multizone Gradient-Modulated Guard Ring Technique for Ultrahigh …
WebJul 31, 2000 · An optimized multiple floating guard ring structure is investigated for the first time as an edge termination method for high voltage 4H-SiC planar devices. Simulations were performed to investigate SiC guard ring termination, and determine the optimum guard ring spacing for planar diodes with up to four floating rings. Simulated optimized designs … WebApr 11, 2024 · An area efficient multizone gradient-modulated guard ring (MGM-GR) edge termination technique is proposed, fabricated, and analyzed for 10-kV class silicon carbide devices without extra process steps or masks, which provides a better tradeoff between near ideal blocking capabilities and technological process complexity. The edge … WebSep 1, 2024 · A robust and area efficient adjusted multi-section guard rings (AMS) edge termination structure is employed to a 4H-SiC power MOSFET device rated at 1.7 kV and fabricated without extra process steps or masks in this paper.The lightly doped p-type guard ring with adjusted multi-section spacing, which is similar with varied lateral doping … the “mistake” mentioned in line 43 was to